sudo smartctl -a /dev/sdd

最关键结论（一眼看懂硬盘是否健康）：

🔵 ​​SMART overall-health self-assessment test result: PASSED​​

✅ ​​这是最重要的指标！它明确告诉你：你的硬盘整体健康状态目前是良好的，没有检测到任何严重的硬件问题。​​

sudo apt update
sudo apt install smartmontools
sudo smartctl -a /dev/sdd

20250911 1537

vincent@Vincent-System-Product-Name:~$ sudo smartctl -a /dev/sdd
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-6.11.8-10-generic] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     Teclast 1TB A850
Serial Number:    AA000000005260001517
Firmware Version: T0317A0
User Capacity:    1,000,204,886,016 bytes [1.00 TB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      2.5 inches
TRIM Command:     Available
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ACS-3 T13/2161-D revision 4
SATA Version is:  SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Thu Sep 11 15:32:33 2025 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  120) seconds.
Offline data collection
capabilities: 			 (0x11) SMART execute Offline immediate.
					No Auto Offline data collection support.
					Suspend Offline collection upon new
					command.
					No Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					No Selective Self-test supported.
SMART capabilities:            (0x0002)	Does not save SMART data before
					entering power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  10) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x0032   100   100   050    Old_age   Always       -       0
  5 Reallocated_Sector_Ct   0x0032   100   100   050    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   050    Old_age   Always       -       21558
 12 Power_Cycle_Count       0x0032   100   100   050    Old_age   Always       -       1542
160 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       0
161 Unknown_Attribute       0x0033   100   100   050    Pre-fail  Always       -       100
163 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       14
164 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       39746
165 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       265
166 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       182
167 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       192
168 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       2000
169 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       91
175 Program_Fail_Count_Chip 0x0032   100   100   050    Old_age   Always       -       0
176 Erase_Fail_Count_Chip   0x0032   100   100   050    Old_age   Always       -       0
177 Wear_Leveling_Count     0x0032   100   100   050    Old_age   Always       -       0
178 Used_Rsvd_Blk_Cnt_Chip  0x0032   100   100   050    Old_age   Always       -       0
181 Program_Fail_Cnt_Total  0x0032   100   100   050    Old_age   Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   050    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0032   100   100   050    Old_age   Always       -       264
194 Temperature_Celsius     0x0022   100   100   050    Old_age   Always       -       40
195 Hardware_ECC_Recovered  0x0032   100   100   050    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   100   100   050    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   100   100   050    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0032   100   100   050    Old_age   Always       -       0
199 UDMA_CRC_Error_Count    0x0032   100   100   050    Old_age   Always       -       0
232 Available_Reservd_Space 0x0032   100   100   050    Old_age   Always       -       100
241 Total_LBAs_Written      0x0030   100   100   050    Old_age   Offline      -       1334262
242 Total_LBAs_Read         0x0030   100   100   050    Old_age   Offline      -       1745499
245 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       6098816

SMART Error Log Version: 1
Warning: ATA error count 0 inconsistent with error log pointer 1

ATA Error Count: 0
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error -4 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  00 00 00 00 00 00 00

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ea 00 00 88 fd 01 a0 08      00:00:00.000  FLUSH CACHE EXT
  ca 00 08 98 fd 01 e8 08      00:00:00.000  WRITE DMA
  ea 00 00 98 fd 01 a0 08      00:00:00.000  FLUSH CACHE EXT
  ec 00 01 00 00 00 00 08      00:00:00.000  IDENTIFY DEVICE
  ca 00 10 88 fd 01 e8 08      00:00:00.000  WRITE DMA

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

Selective Self-tests/Logging not supported

vincent@Vincent-System-Product-Name:~$

腾讯元宝的回答：...